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Modeling fatigue life of power semiconductor devices with ε-N fields.

Olivia BluderKathrin PlankensteinerMichael NelhiebelWalther HeinzChristian Leitner
Published in: WSC (2014)
Keyphrases
  • semiconductor devices
  • power consumption
  • daily life
  • database
  • data mining
  • social networks
  • computer vision
  • low cost
  • steady state
  • spatial objects
  • electron beam