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A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data.
Stefan Schrunner
Olivia Bluder
Anja Zernig
Andre Kästner
Roman Kern
Published in:
ICMLA (2018)
Keyphrases
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test data
pattern recognition
training data
semiconductor manufacturing
image processing
test cases
test set
signal processing
training set
databases
data sets
neural network
testing process
pairwise
supervised learning
feature space
text categorization
support vector
computer vision
process control