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Characterization of cyclic delamination behavior of thin film multilayers.

T. WalterGolta KhatibiMichael NelhiebelM. Stefenelli
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • thin film
  • high density
  • short circuit
  • grain size
  • solar cell
  • data analysis
  • electron microscopy
  • multi layer
  • chemical vapor deposition