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Refined NBTI characterization of arbitrarily stressed PMOS devices at ultra-low and unique temperatures.

Thomas AichingerMichael NelhiebelTibor Grasser
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • mobile devices
  • high speed
  • embedded systems
  • embedded devices
  • real time
  • information systems
  • user interface
  • highly correlated
  • high levels
  • navigation systems
  • electronic devices
  • remains unclear