Login / Signup

Exploring the thermal limit of GaN power devices under extreme overload conditions.

Florian Peter PribahsnikMichael NelhiebelM. MatalnMirko BernardoniG. PrechtlFrank AltmannDavid PoppitzA. Lindemann
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • sufficient conditions
  • power consumption
  • infrared
  • mobile devices
  • response time
  • environmental conditions
  • electrical power
  • embedded devices
  • high temperature
  • battery life