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Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.

Rudolf SchlangenHervé DeslandesTed R. LundquistC. SchmidtFrank AltmannK. YuA. AndreasyanS. Li
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • fault localization
  • infrared
  • model based diagnosis
  • program understanding
  • artificial intelligence
  • neural network
  • information systems
  • case study
  • high level
  • data structure
  • general purpose