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B. Burchard
Publication Activity (10 Years)
Years Active: 2016-2016
Publications (10 Years): 1
Top Topics
Key Issues
Empirical Evaluation
Top Venues
Microelectron. Reliab.
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Publications
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Falk Naumann
,
V. Gottschalk
,
B. Burchard
,
Frank Altmann
Reliability evaluation of Si-dies due to assembly issues.
Microelectron. Reliab.
64 (2016)