EMPIRICAL EVALUATION
Experts
- Nathaniel Huber-Fliflet
- Zahir Irani
- Haozhen Zhao
- Sabarish V. Babu
- Marcello Federico
- Sebastian Stüker
- Jan Niehues
- Luigi Lavazza
- Shin Yoo
- Peter E. D. Love
- Lionel C. Briand
- Sandro Morasca
- Jakob Pinggera
- Lutz Bornmann
- Roee Aharoni
- Carl-Johan H. Seger
- Ruyun Chen
- Pedro M. d'Orey
- Thomas Scialom
- Stefan Wagner
- Rishi Chhatwal
- Mauro Cettolo
- Barbara Weber
- Lech Madeyski
- Jianping Zhang
- Akito Monden
- Burak Turhan
- Robert Keeling
- Hatem Haddad
- James Miller
- Maya Daneva
- Lei Xie
- William M. Farmer
- Qi Wang
- Lukás Burget
- Dirk Beyer
- David Scott Warren
- Alex Waibel
- Marilyn A. Walker
Venues
- CoRR
- Inf. Softw. Technol.
- Sensors
- Scientometrics
- CHI
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- INTERSPEECH
- IEEE Access
- EMBC
- J. Syst. Softw.
- LREC
- Empir. Softw. Eng.
- IGARSS
- IACR Cryptol. ePrint Arch.
- Comput. J.
- Numer. Algorithms
- Microelectron. Reliab.
- ICASSP
- IEEE Trans. Software Eng.
- HICSS
- J. Assoc. Inf. Sci. Technol.
- SMC
- AMIA
- WSC
- AMCIS
- Entropy
- CHI Extended Abstracts
- Reliab. Eng. Syst. Saf.
- Commun. ACM
- IWSLT
- J. Comput. Appl. Math.
- Inf. Process. Manag.
- VTC Spring
- ISSRE
- VTC Fall
- Decis. Support Syst.
- J. Intell. Fuzzy Syst.
- ICIS
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