Login / Signup
Reliability evaluation of Si-dies due to assembly issues.
Falk Naumann
V. Gottschalk
B. Burchard
Frank Altmann
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
evaluation criteria
database
data sets
image processing
empirical evaluation
gold standard
real time
artificial intelligence
digital libraries
key issues
evaluation method
comparative evaluation
evaluation methodology
database replication