Felix Beaudoin

Publication Activity (10 Years)

Years Active: 2001-2007
Publications (10 Years): 0

Publications

Felix Beaudoin, Kevin Sanchez, Philippe Perdu
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47 (9-11) (2007)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45 (9-11) (2005)
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45 (9-11) (2005)
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45 (9-11) (2005)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45 (9-11) (2005)
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45 (9-11) (2005)
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44 (9-11) (2004)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44 (9-11) (2004)
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44 (9-11) (2004)
Xavier Lafontan, Francis Pressecq, Felix Beaudoin, Sebastien Rigo, M. Dardalhon, J.-L. Roux, Petra Schmitt, J. Kuchenbecker, B. Baradat, Djemel Lellouchi
The advent of MEMS in space. Microelectron. Reliab. 43 (7) (2003)
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43 (1) (2003)
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43 (9-11) (2003)
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43 (9-11) (2003)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC (2003)
Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42 (9-11) (2002)
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)
Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal
A 2.5 Gbit/s CMOS optical receiver frontend. ISCAS (5) (2002)
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41 (9-10) (2001)
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Philippe Perdu, Felix Beaudoin
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41 (9-10) (2001)