Frédéric Darracq

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 3

Top Topics

Positive And Negative

Detection Method

Top Venues

Microelectron. Reliab.

IEEE Trans. Circuits Syst. I Regul. Pap.

Publications

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet
A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (12) (2023)
Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat
Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors. IRPS (2018)
Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices. Microelectron. Reliab. (2017)
Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54 (9-10) (2014)
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53 (9-11) (2013)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43 (9-11) (2003)
Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW (2001)