Leonardo Heitich Brendler

Publication Activity (10 Years)

Years Active: 2018-2023
Publications (10 Years): 15

Top Topics

Positive Effects

Silicon Dioxide

Assessment Tool

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

Publications

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet
A Tool for Automatic Radiation-Hardened SRAM Layout Generation. ICECS (2023)
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS (2023)
Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet
A MCU-robust Interleaved Data/Detection SRAM for Space Environments. ISVLSI (2023)
Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI (2023)
Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet
A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (12) (2023)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS (2021)
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS (2021)
Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes
Circuit Level Design Methods to Mitigate Soft Errors. LATS (2020)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS (2020)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. (2) (2020)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC (2018)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS (2018)