Alexandra L. Zimpeck

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 34

Top Topics

Silicon Dioxide

Negative Impact

Top Venues

Microelectron. Reliab.

Publications

Alexandra L. Zimpeck, Alexander Fish
Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023). IEEE Trans. Circuits Syst. I Regul. Pap. 71 (3) (2024)
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS (2023)
Gabriel Lima Jacinto, Cínthia Schneider, Alexandra L. Zimpeck, Mateus Grellert, Cristina Meinhardt
Fast and Low-Error Prediction of Logic Gate Cell Characterization. ICECS (2023)
Gerson D. Andrade, Matheus Silva, Cínthia Schneider, Guilherme Paim, Sergio Bampi, Eduardo Costa, Alexandra L. Zimpeck
Robustness Analysis of 3-2 Adder Compressor Designed in 7-nm FinFET Technology. IEEE Trans. Circuits Syst. II Express Briefs 70 (3) (2023)
Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI (2023)
Fábio G. R. G. da Silva, Rafael N. M. Oliveira, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology. Integr. 87 (2022)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Current Behavior on Process Variability Aware FinFET Inverter Designs. LASCAS (2021)
Gerson D. Andrade, Ricardo A. L. Reis, Eduardo A. C. da Costa, Alexandra L. Zimpeck
Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy. APCCAS (2021)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS (2021)
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS (2021)
Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes
Circuit Level Design Methods to Mitigate Soft Errors. LATS (2020)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS (2020)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Pros and Cons of ST and SIG FinFET Inverters for Low Power Designs. ISCAS (2020)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. (2) (2020)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Exploring Schmitt Trigger Circuits for Process Variability Mitigation. NEWCAS (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC (2019)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability. VLSI-SoC (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC (2019)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC (2019)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. ICECS (2019)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Robustness and Minimum Energy-Oriented FinFET Design. VLSI-SoC (2019)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) (2019)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Impact of different transistor arrangements on gate variability. Microelectron. Reliab. (2018)
Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt
Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders. ISCAS (2018)
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Evaluation of variability using Schmitt trigger on full adders layout. Microelectron. Reliab. (2018)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC (2018)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS (2018)
Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis
Robustness of Sub-22nm multigate devices against physical variability. ISCAS (2017)
Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt
Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders. ICECS (2017)
Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. ICECS (2017)
Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Permanent and single event transient faults reliability evaluation EDA tool. Microelectron. Reliab. 64 (2016)
Alexandra L. Zimpeck, Ricardo Reis
Impact of variability effects on FinFET transistors and combinational cells. ICECS (2016)
Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Augusto da Luz Reis
FinFET cells with different transistor sizing techniques against PVT variations. ISCAS (2016)
Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis
Geometric variability impact on 7nm Trigate combinational cells. ICECS (2016)
Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis
Analyzing the Impact of Frequency and Diverse Path Delays in the Time Vulnerability Factor of Master-Slave D Flip-Flops. ISVLSI (2015)
Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis
Process variability in FinFET standard cells with different transistor sizing techniques. ICECS (2015)
Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
Impact of PVT variability on 20 nm FinFET standard cells. Microelectron. Reliab. 55 (9-10) (2015)
Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices. PATMOS (2014)
Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. Microelectron. Reliab. 54 (9-10) (2014)
Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo Augusto da Luz Reis
Impact of gate workfunction fluctuation on FinFET standard cells. ICECS (2014)