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Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit.
Leonardo Heitich Brendler
Alexandra L. Zimpeck
Fernanda Lima Kastensmidt
Cristina Meinhardt
Ricardo A. L. Reis
Published in:
LASCAS (2021)
Keyphrases
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low voltage
duty cycle
high speed
error rate
power system
short circuit
single phase
social influence
data sets
error analysis
real time
scaling factors
prediction error
field effect transistors
genetic algorithm
relative error
error detection
digital circuits
analog circuits
error bounds
delay insensitive