DUTY CYCLE
Experts
- Tian He
- Yu Gu
- Taewhan Kim
- Marian K. Kazimierczuk
- Ming-Dou Ker
- Baris Taskin
- Anfeng Liu
- Chulwoo Kim
- Eby G. Friedman
- Shen-Iuan Liu
- Kuo-Hsing Cheng
- Jianwei Niu
- Takahiro J. Yamaguchi
- Long Cheng
- Haruo Kobayashi
- Shih-Hsu Huang
- Vivek De
- Saibal Mukhopadhyay
- Guihai Chen
- Zhichao Cao
- Pavan Kumar Hanumolu
- Tian Wang
- Diana Marculescu
- Kari Halonen
- Zhi Chen
- Wing-Hung Ki
- Jaehyouk Choi
- Akira Matsuzawa
- Vishwani D. Agrawal
- C. Mani Krishna
- Ching-Yuan Yang
- Yao-Wen Chang
- Wei-Bin Yang
- Massimo Alioto
- Shailesh Singh Chouhan
- Shuo Guo
- Hengjing Liang
- Shaoqian Li
- Monodeep Kar
Venues
- IEEE Trans. Ind. Electron.
- ISCAS
- IECON
- IEEE Access
- IEEE J. Solid State Circuits
- CoRR
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEICE Electron. Express
- Sensors
- ICECS
- Microelectron. J.
- ISSCC
- CICC
- IEICE Trans. Electron.
- Int. J. Circuit Theory Appl.
- MWSCAS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICCAD
- ESSCIRC
- J. Circuits Syst. Comput.
- Microelectron. Reliab.
- DATE
- DAC
- ASP-DAC
- ISQED
- SoCC
- ISIE
- IAS
- ASICON
- ICCD
- APCCAS
- GLOBECOM
- ACM Great Lakes Symposium on VLSI
- IEEE Trans. Smart Grid
- VLSI Design
- I2MTC
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