• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Process Variability Impact on the SET Response of FinFET Multi-level Design.

Leonardo Heitich BrendlerAlexandra L. ZimpeckCristina MeinhardtRicardo Reis
Published in: VLSI-SoC (Selected Papers) (2019)
Keyphrases