Sign in

Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility.

Alexandra L. ZimpeckCristina MeinhardtLaurent ArtolaGuillaume HubertFernanda Lima KastensmidtRicardo Augusto da Luz Reis
Published in: ICECS (2019)
Keyphrases
  • neural network
  • information retrieval
  • artificial intelligence
  • process model
  • development process
  • improve quality