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Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations.

Cristina MeinhardtAlexandra L. ZimpeckRicardo A. L. Reis
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • physical characteristics
  • data mining
  • information technology
  • real time
  • data sets
  • three dimensional
  • evaluation method
  • geometric structure
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