Login / Signup
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures.
Cleiton Magano Marques
Leonardo Heitich Brendler
Frédéric Wrobel
Alexandra L. Zimpeck
Walter E. Calienes Bartra
Paulo F. Butzen
Cristina Meinhardt
Published in:
SBCCI (2023)
Keyphrases
</>
database
computer vision
information systems
statistical analysis
quantitative analysis
artificial intelligence
power consumption