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Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs.
Alexandra L. Zimpeck
Cristina Meinhardt
Laurent Artola
Guillaume Hubert
Fernanda Lima Kastensmidt
Ricardo Augusto da Luz Reis
Published in:
VLSI-SoC (2019)
Keyphrases
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levels of abstraction
image processing
real time
computer vision
artificial neural networks
higher level
process model