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FinFET cells with different transistor sizing techniques against PVT variations.

Alexandra L. ZimpeckCristina MeinhardtGracieli PosserRicardo Augusto da Luz Reis
Published in: ISCAS (2016)
Keyphrases
  • high speed
  • integrated circuit
  • low power
  • markov chain
  • microscopy images
  • genetic algorithm
  • learning algorithm
  • information systems
  • visual cortex
  • view angle
  • power losses