Rafael B. Schvittz

Publication Activity (10 Years)

Years Active: 2018-2023
Publications (10 Years): 15

Top Topics

Reliability Analysis

Top Venues

Publications

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. 39 (4) (2023)
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS (2023)
Matheus F. Pontes, Ingrid F. V. Oliveira, Rafael B. Schvittz, Leomar S. Rosa, Paulo F. Butzen
The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis. ISCAS (2022)
Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt
Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. SBCCI (2022)
Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS (2022)
Ingrid F. V. Oliveira, Matheus F. Pontes, Rafael B. Schvittz, S. Leomar Rosa, Paulo F. Butzen, Rafael Iankowski Soares
Fault Tolerance Evaluation of Different Majority Voter Designs. ISCAS (2022)
Tiago R. Balen, Carlos J. Gonzalez, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei A. Guazzelli, Nilberto H. Medina, Paulo F. Butzen
Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS (2021)
Rafael B. Schvittz, Paulo F. Butzen, Leomar S. da Rosa
Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients. ITC (2020)
Rafael B. Schvittz, Leomar Soares, Paulo Francisco Butzen
Exploring Logic Gates Layout to Improve the Accuracy of Circuit Reliability Estimation. VLSI-SoC (2019)
Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen
An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. VLSI-SoC (Selected Papers) (2019)
Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares, Paulo Francisco Butzen
A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates. VLSI-SoC (2019)
Matheus F. Pontes, Paulo F. Butzen, Rafael B. Schvittz, S. Leomar Rosa, Denis Teixeira Franco
The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits. ICECS (2018)
Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen
Reliability evaluation of circuits designed in multi- and single-stage versions. LASCAS (2018)
Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa Jr., Paulo F. Butzen
Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults. ICECS (2018)
Ingrid F. V. Oliveira, Rafael B. Schvittz, Paulo F. Butzen
Fault masking ratio analysis of majority voters topologies. LATS (2018)