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An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.
Rafael B. Schvittz
Denis Teixeira Franco
Leomar S. da Rosa
Paulo F. Butzen
Published in:
VLSI-SoC (Selected Papers) (2019)
Keyphrases
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logic programming
steady state
event detection
evaluation method
fault diagnosis
evaluation methods
abnormal events
story link detection
database
information retrieval
evaluation criteria
model based diagnosis
classical logic
multiple faults
nano scale