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Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
I. El Moukhtari
Vincent Pouget
C. Larue
Frédéric Darracq
Dean Lewis
Philippe Perdu
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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real time
data sets
positive and negative
decision trees
power consumption
data transmission
event driven
power reduction