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Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.

I. El MoukhtariVincent PougetC. LarueFrédéric DarracqDean LewisPhilippe Perdu
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • real time
  • data sets
  • positive and negative
  • decision trees
  • power consumption
  • data transmission
  • event driven
  • power reduction