Thierry Carrière

Publication Activity (10 Years)

Years Active: 2003-2015
Publications (10 Years): 1

Top Topics

Delaunay Triangulation

Top Venues

Microelectron. Reliab.

Publications

Cécile Weulersse, Florent Miller, Thierry Carrière, R. Mangeret
Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool. Microelectron. Reliab. 55 (9-10) (2015)
Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS (2007)
Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS (2006)
Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS (2005)
Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43 (9-11) (2003)