Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Frédéric DarracqHervé LapuyadeNadine BuardPascal FouillatR. DufayelThierry CarrièrePublished in: Microelectron. Reliab. (2003)
Keyphrases
- low cost
- high accuracy
- preprocessing
- pairwise
- optimization algorithm
- highly efficient
- prior knowledge
- significant improvement
- sensitivity analysis
- detection method
- computational cost
- computationally efficient
- support vector machine
- clustering method
- segmentation algorithm
- similarity measure
- optimization method
- dynamic programming
- high precision
- input data
- segmentation method
- synthetic data
- decision support
- experimental evaluation
- cost function
- objective function