R. Dufayel

Publication Activity (10 Years)

Years Active: 2003-2003
Publications (10 Years): 0

Publications

Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43 (9-11) (2003)