Florent Miller

Publication Activity (10 Years)

Years Active: 2006-2022
Publications (10 Years): 2

Top Topics

Fault Tolerance

Delaunay Triangulation

Top Venues

Microelectron. Reliab.

Publications

Luc Noizette, Florent Miller, Thierry Colladant, Youri Helen, Régis Leveugle
Using Application Profiling based on a Virtual Platform for SoC Fault Tolerance Assessment. PRIME (2022)
Thomas Santini, Sébastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall, Bruno Allard
Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. Microelectron. Reliab. 75 (2017)
Cécile Weulersse, Florent Miller, Thierry Carrière, R. Mangeret
Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool. Microelectron. Reliab. 55 (9-10) (2015)
Thomas Santini, Sébastien Morand, Mitra Fouladirad, Luong-Viêt Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard
Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectron. Reliab. 54 (9-10) (2014)
Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. Microelectron. Reliab. 52 (9-10) (2012)
Antonin Bougerol, Florent Miller, Nadine Buard
Novel DRAM mitigation technique. IOLTS (2009)
Antonin Bougerol, Florent Miller, Nadine Buard
SDRAM Architecture & Single Event Effects Revealed with Laser. IOLTS (2008)
Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard
Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? IOLTS (2007)
Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS (2006)