Luong-Viêt Phung

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 5

Top Topics

Cmos Technology

Highly Parallel

Schottky Barrier

Distribution Network

Top Venues

Microelectron. Reliab.

IEEE Trans. Ind. Electron.

Publications

Ralph Makhoul, Abdelhakim Bourennane, Luong-Viêt Phung, Frédéric Richardeau, Mihai Lazar, Nour Beydoun, Sergueï Kostcheev, Philippe Godignon, Dominique Planson, Hervé Morel, David Bourrier
Full-SiC Single-Chip Buck and Boost MOSFET-JBS Converters for Ultimate Efficient Power Vertical Integration. MIXDES (2023)
P. Vigneshwara Raja, Christophe Raynaud, Camille Sonneville, Atse Julien Eric N'Dohi, Hervé Morel, Luong-Viêt Phung, Thi Huong Ngo, Philippe De Mierry, Éric Frayssinet, Hassan Maher, Josiane Tasselli, Karine Isoird, Frédéric Morancho, Yvon Cordier, Dominique Planson
Comprehensive characterization of vertical GaN-on-GaN Schottky barrier diodes. Microelectron. J. 128 (2022)
Mickaël Lallart, Luong-Viêt Phung, Bertrand Massot
Transformer-Free, Off-the-Shelf Electrical Interface for Low-Voltage DC Energy Harvesting. IEEE Trans. Ind. Electron. 65 (7) (2018)
Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong-Viêt Phung, Blaise Jacquier, Philippe Galy
Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes. Microelectron. Reliab. 85 (2018)
M. L. Beye, Jean-François Mogniotte, Luong-Viêt Phung, H. Maher, Bruno Allard
Active Gate Driver and Management of the Current Switching Speed in GaN Transistors During Tum-On. IECON (2018)
Thomas Santini, Sébastien Morand, Mitra Fouladirad, Luong-Viêt Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard
Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectron. Reliab. 54 (9-10) (2014)