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Comprehensive characterization of vertical GaN-on-GaN Schottky barrier diodes.

P. Vigneshwara RajaChristophe RaynaudCamille SonnevilleAtse Julien Eric N'DohiHervé MorelLuong-Viêt PhungThi Huong NgoPhilippe De MierryÉric FrayssinetHassan MaherJosiane TasselliKarine IsoirdFrédéric MoranchoYvon CordierDominique Planson
Published in: Microelectron. J. (2022)
Keyphrases
  • schottky barrier
  • structuring elements
  • database
  • databases
  • gray scale
  • data sets
  • real world
  • image analysis
  • high density
  • reinforcement learning
  • information technology
  • multiresolution
  • field effect transistors