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- Thomas Mikolajick
- Koichi Narahara
- Tsuyoshi Funaki
- Gabriel A. Rincón-Mora
- Udo Schwalke
- Masud H. Chowdhury
- Giovanni Spagnuolo
- Byung-Gook Park
- Morteza Gholipour
- Tillmann Krauss
- Azzedin D. Es-Sakhi
- Giovanni Petrone
- Ying-Yu Chen
- Chun-Hsing Shih
- Deming Chen
- Toshiya Sakata
- Samir Kouro
- Annalisa Bonfiglio
- Carlos Andrés Ramos-Paja
- Wojciech Knap
- Rajiv Damodaran Prabha
- Ravinder Dahiya
- Huili Grace Xing
- Pierre-Emmanuel Gaillardon
- Frank Wessely
- Walter M. Weber
- Juan David Bastidas-Rodriguez
- Debdeep Jena
- Min-Chul Sun
- In Man Kang
- Yiming Li
- Hyungjin Kim
- Alexander Kloes
- Kohei Sasaki
- Abbas Panahi
- Young Jun Yoon
- Peter Anthony Iannucci
- Jérôme Mitard
- Yan Liu
Venues
- Sensors
- IEEE Access
- Microelectron. Reliab.
- Microelectron. J.
- IEICE Trans. Electron.
- DRC
- CoRR
- IEICE Electron. Express
- IECON
- IEEE Trans. Ind. Electron.
- IET Circuits Devices Syst.
- ISCAS
- ESSDERC
- IEEE Trans. Instrum. Meas.
- NEMS
- Sci. China Inf. Sci.
- ASICON
- Adv. Intell. Syst.
- IEEE SENSORS
- MIXDES
- Proc. IEEE
- IRPS
- ISIE
- SSD
- ICICDT
- IEEE Trans. Circuits Syst. II Express Briefs
- NANOARCH
- I2MTC
- ISOCC
- J. Circuits Syst. Comput.
- MWSCAS
- Math. Comput. Simul.
- ISLPED
- Int. J. Circuit Theory Appl.
- ISGT Europe
- MIPRO
- ESSCIRC
- J. Low Power Electron.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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