SCHOTTKY BARRIER
Experts
- Thomas Mikolajick
- Udo Schwalke
- Koichi Narahara
- Tsuyoshi Funaki
- Masud H. Chowdhury
- Gabriel A. Rincón-Mora
- Giovanni Petrone
- Morteza Gholipour
- Giovanni Spagnuolo
- Deming Chen
- Tillmann Krauss
- Ying-Yu Chen
- Chun-Hsing Shih
- Azzedin D. Es-Sakhi
- Byung-Gook Park
- Annalisa Bonfiglio
- Samir Kouro
- Rajiv Damodaran Prabha
- Huili Grace Xing
- Toshiya Sakata
- Debdeep Jena
- Ravinder Dahiya
- Pierre-Emmanuel Gaillardon
- Walter M. Weber
- Carlos Andrés Ramos-Paja
- Frank Wessely
- In Man Kang
- Juan David Bastidas-Rodriguez
- Wojciech Knap
- Min-Chul Sun
- Kai Ni
- Zongyang Hu
- Jérôme Mitard
- Kenneth K. O
- Peter Anthony Iannucci
- Christian Schuss
- Safumi Suzuki
- Nguyen Dang Chien
- Ramesh Vaddi
Venues
- Sensors
- IEEE Access
- Microelectron. Reliab.
- Microelectron. J.
- IEICE Trans. Electron.
- CoRR
- IEICE Electron. Express
- IECON
- DRC
- IEEE Trans. Ind. Electron.
- IET Circuits Devices Syst.
- ESSDERC
- ISCAS
- NEMS
- ASICON
- IEEE SENSORS
- IEEE Trans. Instrum. Meas.
- Sci. China Inf. Sci.
- Proc. IEEE
- MIXDES
- ISIE
- Adv. Intell. Syst.
- SSD
- IRPS
- ICICDT
- IEEE Trans. Circuits Syst. II Express Briefs
- NANOARCH
- ISOCC
- I2MTC
- J. Circuits Syst. Comput.
- Int. J. Circuit Theory Appl.
- ISGT Europe
- MIPRO
- MWSCAS
- ISLPED
- DTIS
- J. Low Power Electron.
- ESSCIRC
- TENCON
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