Chun-Hsing Shih

Publication Activity (10 Years)

Years Active: 2004-2017
Publications (10 Years): 2

Top Topics

Schottky Barrier

High Speed Networks

Semiconductor Devices

Mathematical Analysis

Top Venues

Microelectron. Reliab.

Publications

Chun-Hsing Shih, Yen-Hsiang Lo, Yu-Hsuan Chen, Jr-Jie Tsai
Impact of gate-to-source/drain misalignments on source-side injection Schottky barrier charge-trapping memory cells evaluated using numerical programming-trapping iterations. Microelectron. Reliab. 74 (2017)
Nguyen Dang Chien, Nguyen Thi Thu, Chun-Hsing Shih, Luu The Vinh
Different scalabilities of N- and P-type tunnel field-effect transistors with Si/SiGe heterojunctions. ICICDT (2016)
Nguyen Dang Chien, Chun-Hsing Shih
Short-channel effect and device design of extremely scaled tunnel field-effect transistors. Microelectron. Reliab. 55 (1) (2015)
Yu-Hsuan Chen, Jr-Jie Tsai, Yan-Xiang Luo, Chun-Hsing Shih
Iterative programming analysis of dopant-segregated multibit/cell Schottky barrier charge-trapping memories. NVMTS (2015)
Wei Chang, Chun-Hsing Shih, Yan-Xiang Luo, Wen-Fa Wu, Chen-Hsin Lien
Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire charge-trapping memories. Microelectron. Reliab. 55 (1) (2015)
Nguyen Dang Chien, Chun-Hsing Shih, Luu The Vinh, Nguyen Van Kien
Quantum confinement effect in strained-Si1-xGex double-gate tunnel field-effect transistors. ICICDT (2013)
Chun-Hsing Shih, Yi-Min Chen, Chen-Hsin Lien
Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET. Microelectron. Reliab. 44 (7) (2004)