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Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire charge-trapping memories.
Wei Chang
Chun-Hsing Shih
Yan-Xiang Luo
Wen-Fa Wu
Chen-Hsin Lien
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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high speed
schottky barrier
shift register
charge coupled device
low power
real time
failure rate
highly reliable
high speed networks
low cost
reliability analysis
data sets
databases
learning algorithm
cloud computing
frame rate