CHARGE COUPLED DEVICE
Experts
- Shoji Kawahito
- Keita Yasutomi
- Hua Wang
- Edoardo Charbon
- Keiichiro Kagawa
- David Stoppa
- Robert K. Henderson
- Pantelis Georgiou
- Vladimir Stojanovic
- Kenneth K. O
- Jong Seok Park
- Nicole McFarlane
- Min-Woong Seo
- Zhengyuan Xu
- Andreas G. Andreou
- Krishnendu Chakrabarty
- Hee Cheol Cho
- George Jie Yuan
- Sung Min Park
- Chang-Tsun Li
- Youngcheol Chae
- Yoshiaki Nakano
- Chen Gong
- Pawel Grybos
- Kazuaki Sawada
- Doohwan Jung
- Takuo Tanemura
- Kiichi Niitsu
- Frederic Nabki
- Fausto Borghetti
- Steve Collins
- Jong-Ryul Yang
- Tetsuya Kawanishi
- Matteo Perenzoni
- Daniel M. Kuchta
- Werner Brockherde
- Kaiming Nie
- Taiyun Chi
- Kenneth L. Shepard
Venues
- Sensors
- IEEE J. Solid State Circuits
- ISCAS
- OFC
- ISSCC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Circuits Syst. II Express Briefs
- CoRR
- IEEE Access
- CICC
- ICECS
- Microelectron. J.
- IEICE Electron. Express
- MWSCAS
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ESSCIRC
- IEEE SENSORS
- ECOC
- ICTON
- NEMS
- IEICE Trans. Electron.
- EMBC
- BioCAS
- Microelectron. Reliab.
- IEEE Trans. Medical Imaging
- Digital Photography
- IEEE Trans. Biomed. Circuits Syst.
- ICASSP
- IEEE Trans. Very Large Scale Integr. Syst.
- J. Electronic Imaging
- PICS
- IGARSS
- OFC/NFOEC
- ISCAS (1)
- IEEE Trans. Consumer Electron.
- IMSE
- IEEE Trans. Commun.
- IEEE Trans. Ind. Electron.
- NEWCAS
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