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Impact of gate-to-source/drain misalignments on source-side injection Schottky barrier charge-trapping memory cells evaluated using numerical programming-trapping iterations.

Chun-Hsing ShihYen-Hsiang LoYu-Hsuan ChenJr-Jie Tsai
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • programming language
  • schottky barrier
  • database
  • neural network
  • low power
  • memory usage
  • memory space