Rémi Gaillard

Publication Activity (10 Years)

Years Active: 2005-2012
Publications (10 Years): 0

Top Topics

Selection Mechanism

Statistical Tests

Top Venues

Microelectron. Reliab.

Publications

Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. Microelectron. Reliab. 52 (9-10) (2012)
Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS (2008)
Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS (2007)
Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard
Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? IOLTS (2007)
Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS (2006)
Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS (2005)