Shi-Jie Wen

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 25

Top Topics

Anomaly Detection

Content Addressable

Fully Integrated

Top Venues

Microelectron. Reliab.

J. Electron. Test.

IEICE Electron. Express

Publications

Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. IRPS (2023)
Zhuangwei Kang, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey
Traffic Anomaly Detection Via Conditional Normalizing Flow. ITSC (2022)
Zhuangwei Kang, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey
Generative Anomaly Detection for Time Series Datasets. CoRR (2022)
Yoni Xiong, Alexandra Feeley, N. J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS (2022)
Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS (2021)
Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access 9 (2021)
Sanchita Basak, Saptarshi Sengupta, Shi-Jie Wen, Abhishek Dubey
Spatio-temporal AI inference engine for estimating hard disk reliability. Pervasive Mob. Comput. 70 (2021)
Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS (2020)
Andrew Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. IRPS (2020)
Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS (2020)
Dmitry Goloubev, Shi-Jie Wen, Donald Allen, Ranjani Ram, Firdous Bano, Nithin Guruswamy, James Turman
Use of Silicon-based Sensors for System Reliability Prediction. IRPS (2020)
Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva
High-Current State triggered by Operating-Frequency Change. IRPS (2020)
Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. IEEE J. Solid State Circuits 54 (1) (2019)
Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim
A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. ISSCC (2018)
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87 (2018)
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80 (2018)
Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen
IZIP: In-place zero overhead interconnect protection via PIP redundancy. ASICON (2017)
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS (2017)
Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. 69 (2017)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13 (19) (2016)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13 (17) (2016)
Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates
Terrestrial SER characterization for nanoscale technologies: A comparative study. IRPS (2015)
GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS (2015)
Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen
New insights into the impact of SEUs in FPGA CRAMs. IEICE Electron. Express 12 (6) (2015)
Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
Analysis of advanced circuits for SET measurement. IRPS (2015)
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30 (6) (2014)
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30 (1) (2014)
Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS (2014)
Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen
Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectron. Reliab. 54 (11) (2014)
Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC (2013)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37 (8-D) (2013)
Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen
Error detection in ternary CAMs using bloom filters. DATE (2013)
Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electron. Test. 29 (2) (2013)
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29 (4) (2013)
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis
Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. ISQED (2013)
Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong
Placement of repair circuits for in-field FPGA repair. FPGA (2013)
Richard Wong, Rita Fung, Shi-Jie Wen
Networking industry trends in ESD protection for high speed IOs. ASICON (2013)
Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28 (6) (2012)
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro
RIIF - Reliability information interchange format. IOLTS (2012)
David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2012)
Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He
Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. FPT (2012)
Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He
Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. FPL (2011)
Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. IEEE J. Solid State Circuits 46 (5) (2011)
Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED (2011)
David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong
Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC (2011)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16 (4) (2011)
Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen
Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. ETS (2011)
Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. (4) (2010)
Shi-Jie Wen, Dan Alexandrescu, Renaud Perez
A Systematical Method of Quantifying SEU FIT. IOLTS (2008)
Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS (2008)