Shuting Shi

Publication Activity (10 Years)

Years Active: 2013-2024
Publications (10 Years): 6

Top Topics

Top Venues

J. Electron. Test.

IEEE Trans. Geosci. Remote. Sens.

Microelectron. Reliab.

Publications

Shuting Shi, Baohong Li, Laifu Zhang, Kun Kuang, Sensen Wu, Tian Feng, Yiming Yan, Zhenhong Du
Causality-Guided Stepwise Intervention and Reweighting for Remote Sensing Image Semantic Segmentation. IEEE Trans. Geosci. Remote. Sens. 62 (2024)
Laifu Zhang, Sensen Wu, Minggao Liang, Haoyu Jing, Shuting Shi, Yilin Zhu, Yang Ye, Sheng Huang, Fanen Meng, Zhenhong Du
A Downscaling Framework for Urban Nighttime Light Based on Multifactor Geographically Neural Network Weighted Regression. IEEE Trans. Geosci. Remote. Sens. 62 (2024)
JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen
Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electron. Test. 37 (2) (2021)
Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37 (2) (2021)
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87 (2018)
Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits. J. Electron. Test. 32 (1) (2016)
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30 (1) (2014)
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29 (4) (2013)