Li Chen

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 10

Top Topics

Subgraph Isomorphism

Top Venues

J. Electron. Test.

IEEE Trans. Artif. Intell.

Microelectron. Reliab.

Publications

Ananda Sutradhar, Mustahsin Al Rafi, Pronab Ghosh, F. M. Javed Mehedi Shamrat, Md. Moniruzzaman, Kawsar Ahmed, A. K. M. Azad, Francis M. Bui, Li Chen, Mohammad Ali Moni
An Intelligent Thyroid Diagnosis System Utilizing Multiple Ensemble and Explainable Algorithms With Medical Supported Attributes. IEEE Trans. Artif. Intell. 5 (6) (2024)
JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen
Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electron. Test. 37 (2) (2021)
Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37 (2) (2021)
Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen
A Layout-Based Rad-Hard DICE Flip-Flop Design. J. Electron. Test. 35 (1) (2019)
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87 (2018)
Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32 (2) (2016)
Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits. J. Electron. Test. 32 (1) (2016)
Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32 (1) (2016)
Michael Newton, Brook Danger, Li Chen, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian
Single photon absorption laser facility for single event effect testing. CCECE (2016)
Haibin Wang, Rui Liu, X.-T. Li, Li Chen, David M. Hiemstra, Valeri Kirischian
Total ionizing dose test facilities for micro-electronic circuits. CCECE (2016)
Lixiang Li, Yuanqing Li, Yuan Ma, Li Chen
A novel asymmetrical SRAM cell tolerant to soft errors. CCECE (2015)
Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31 (5-6) (2015)
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30 (6) (2014)
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30 (1) (2014)
Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electron. Test. 29 (2) (2013)
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29 (4) (2013)
Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28 (6) (2012)