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Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.

Shuting ShiRui ChenRui LiuMo ChenChen ShenXuantian LiHaonan TianLi Chen
Published in: J. Electron. Test. (2021)
Keyphrases
  • real time
  • power consumption
  • evaluation model
  • single chip
  • neural network
  • database systems
  • high speed
  • event detection
  • low power
  • evaluation method
  • event recognition
  • dynamic random access memory