Rui Liu

Publication Activity (10 Years)

Years Active: 2014-2021
Publications (10 Years): 7

Top Topics

Dynamic Random Access Memory

Leakage Current

Top Venues

J. Electron. Test.

Microelectron. Reliab.

Publications

Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37 (2) (2021)
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87 (2018)
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS (2017)
Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32 (2) (2016)
Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32 (1) (2016)
Haibin Wang, Rui Liu, X.-T. Li, Li Chen, David M. Hiemstra, Valeri Kirischian
Total ionizing dose test facilities for micro-electronic circuits. CCECE (2016)
Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32 (3) (2016)
Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31 (5-6) (2015)
Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
Analysis of advanced circuits for SET measurement. IRPS (2015)
Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li
A Novel Built-in Current Sensor for N-WELL SET Detection. J. Electron. Test. 31 (4) (2015)
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30 (6) (2014)
Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS (2014)