Sanghyeon Baeg

Publication Activity (10 Years)

Years Active: 1994-2024
Publications (10 Years): 17

Top Topics

Fluoroscopic Images

Root Cause Analysis

Architectural Design

Top Venues

Microelectron. Reliab.

IEICE Electron. Express

Publications

Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. IRPS (2024)
Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. IRPS (2023)
Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access 9 (2021)
Kiseok Lee, Jeonghwan Kim, Sanghyeon Baeg
Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics. IEEE Access 9 (2021)
Muhammad Waqar, GeunYong Bak, Junhyeong Kwon, Sanghyeon Baeg
DDR4 Data Channel Failure Due to DC Offset Caused by Intermittent Solder Ball Fracture in FBGA Package. IEEE Access 9 (2021)
Ali Ahmed, Kyungbae Park, Saqib Ali Khan, Naeem Maroof, Sanghyeon Baeg
Architectural design tradeoffs in SRAM-based TCAMs. IEICE Electron. Express 16 (13) (2019)
Tan Li, Hosung Lee, GeunYong Bak, Sanghyeon Baeg
Failure signature analysis of power-opens in DDR3 SDRAMs. Microelectron. Reliab. (2018)
Donghyuk Yun, Myungsang Park, Chul Seung Lim, Sanghyeon Baeg
Study of TID effects on one row hammering using gamma in DDR4 SDRAMs. IRPS (2018)
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80 (2018)
Hosung Lee, Sanghyeon Baeg
Signal characteristic and test exploitation for intermittent nanometer-scale cracks. Microelectron. Reliab. 84 (2018)
Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69 (2017)
Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. 69 (2017)
Ali Ahmed, Kyungbae Park, Sanghyeon Baeg
Resource-Efficient SRAM-Based Ternary Content Addressable Memory. IEEE Trans. Very Large Scale Integr. Syst. 25 (4) (2017)
Kyungbae Park, Chul Seung Lim, Donghyuk Yun, Sanghyeon Baeg
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology. Microelectron. Reliab. 57 (2016)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13 (19) (2016)
Kyungbae Park, Donghyuk Yun, Sanghyeon Baeg
Statistical distributions of row-hammering induced failures in DDR3 components. Microelectron. Reliab. 67 (2016)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13 (17) (2016)
GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS (2015)
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30 (6) (2014)
Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers 63 (8) (2014)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37 (8-D) (2013)
Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam
Soft Error Issues with Scaling Technologies. Asian Test Symposium (2012)
Zahid Ullah, Kim Ilgon, Sanghyeon Baeg
Hybrid Partitioned SRAM-Based Ternary Content Addressable Memory. IEEE Trans. Circuits Syst. I Regul. Pap. (12) (2012)
Jongsun Bae, Sanghyeon Baeg, Sungju Park
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. 61 (12) (2012)
Pedro Reviriego, Juan Antonio Maestro, Sanghyeon Baeg
Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors. DAC (2011)
Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED (2011)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16 (4) (2011)
Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. (4) (2010)
Sanghyeon Baeg
A di/dt Compensation Technique in Delay Testing by Disconnecting Power Pins. IEEE Trans. Instrum. Meas. 58 (10) (2009)
Sanghyeon Baeg
Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling. IEEE Trans. Instrum. Meas. 58 (8) (2009)
Sanghyeon Baeg
Low Power Configuration Strategy of TCAM Lookup Table. IEICE Trans. Commun. (3) (2008)
Sanghyeon Baeg
Low-Power Ternary Content-Addressable Memory Design Using a Segmented Match Line. IEEE Trans. Circuits Syst. I Regul. Pap. (6) (2008)
Sanghyeon Baeg
Delay Fault Coverage Enhancement by Partial Clocking for Low-Power Designs With Heavily Gated Clocks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (12) (2007)
Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (11) (2006)
Sanghyeon Baeg, Sung Soo Chung
Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis. IEEE Trans. Very Large Scale Integr. Syst. 13 (3) (2005)
Sung Soo Chung, Sanghyeon Baeg
AC-JTAG: empowering JTAG beyond testing DC nets. ITC (2001)
Sanghyeon Baeg, William A. Rogers
A cost-effective design for testability: clock line control and test generation using selective clocking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (6) (1999)
Sanghyeon Baeg, William A. Rogers
A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits. ICCD (1994)
Sanghyeon Baeg, William A. Rogers
Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. ITC (1994)