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Jongsun Bae
Publication Activity (10 Years)
Years Active: 2012-2012
Publications (10 Years): 0
Top Topics
Advanced Technologies
Approximation Error
High Voltage
Key Issues
Top Venues
IEEE Trans. Instrum. Meas.
Asian Test Symposium
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Publications
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Sanghyeon Baeg
,
Jongsun Bae
,
Soonyoung Lee
,
Chul Seung Lim
,
Sang Hoon Jeon
,
Hyeonwoo Nam
Soft Error Issues with Scaling Technologies.
Asian Test Symposium
(2012)
Jongsun Bae
,
Sanghyeon Baeg
,
Sungju Park
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress.
IEEE Trans. Instrum. Meas.
61 (12) (2012)