Chul Seung Lim

Publication Activity (10 Years)

Years Active: 2012-2018
Publications (10 Years): 4

Top Topics

Technical Issues

Top Venues

Microelectron. Reliab.

Asian Test Symposium

Publications

Donghyuk Yun, Myungsang Park, Chul Seung Lim, Sanghyeon Baeg
Study of TID effects on one row hammering using gamma in DDR4 SDRAMs. IRPS (2018)
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80 (2018)
Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69 (2017)
Kyungbae Park, Chul Seung Lim, Donghyuk Yun, Sanghyeon Baeg
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology. Microelectron. Reliab. 57 (2016)
Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam
Soft Error Issues with Scaling Technologies. Asian Test Symposium (2012)