Soonyoung Lee

Publication Activity (10 Years)

Years Active: 2008-2024
Publications (10 Years): 10

Top Topics

Top Venues

IEEE Trans. Computers

Publications

Minjung Kim, Hyung Lim, Seung Hwan Kim, Soonyoung Lee, Bumsoo Kim, Gunhee Kim
See It All: Contextualized Late Aggregation for 3D Dense Captioning. ACL (Findings) (2024)
Youngtaek Oh, Pyunghwan Ahn, Jinhyung Kim, Gwangmo Song, Soonyoung Lee, In So Kweon, Junmo Kim
Exploring the Spectrum of Visio-Linguistic Compositionality and Recognition. CoRR (2024)
Kwangrok Ryoo, Yeonsik Jo, Seungjun Lee, Mira Kim, Ahra Jo, Seung Hwan Kim, Seungryong Kim, Soonyoung Lee
Universal Noise Annotation: Unveiling the Impact of Noisy annotation on Object Detection. CoRR (2023)
Taehoon Kim, Gwangmo Song, Sihaeng Lee, Sangyun Kim, Yewon Seo, Soonyoung Lee, Seung Hwan Kim, Honglak Lee, Kyunghoon Bae
L-Verse: Bidirectional Generation Between Image and Text. CVPR (2022)
Rodrigo Hormazabal, Changyoung Park, Soonyoung Lee, Sehui Han, Yeonsik Jo, Jaewan Lee, Ahra Jo, Seung Hwan Kim, Jaegul Choo, Moontae Lee, Honglak Lee
CEDe: A collection of expert-curated datasets with atom-level entity annotations for Optical Chemical Structure Recognition. NeurIPS (2022)
Taehoon Kim, Gwangmo Song, Sihaeng Lee, Sangyun Kim, Yewon Seo, Soonyoung Lee, Seung Hwan Kim, Honglak Lee, Kyunghoon Bae
L-Verse: Bidirectional Generation Between Image and Text. CoRR (2021)
Vishnu V. Ratnam, Hao Chen, Sameer Pawar, Bingwen Zhang, Charlie Jianzhong Zhang, Young-Jin Kim, Soonyoung Lee, Minsung Cho, Sung-Rok Yoon
FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications. IEEE Access 9 (2021)
Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. IRPS (2019)
Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. IRPS (2018)
Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69 (2017)
GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS (2015)
Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. IRPS (2015)
Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers 63 (8) (2014)
Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam
Soft Error Issues with Scaling Technologies. Asian Test Symposium (2012)
Soonyoung Lee, Yonghwan Shin, Eunsung Jang, Hwi-Beom Shin
New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler. ICARCV (2008)