Saqib A. Khan

Publication Activity (10 Years)

Years Active: 2016-2017
Publications (10 Years): 3

Top Topics

Random Access Memory

Top Venues

IEICE Electron. Express

Microelectron. Reliab.

Publications

Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69 (2017)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13 (19) (2016)
Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13 (17) (2016)