Sungju Park

Publication Activity (10 Years)

Years Active: 1990-2022
Publications (10 Years): 10

Top Topics

Laparoscopic Surgery

Semiconductor Devices

Integrated Circuit

Top Venues

IEICE Electron. Express

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Trans. Circuits Syst. II Express Briefs

Publications

Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park
Highly Efficient Test Architecture for Low-Power AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (8) (2022)
Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park
Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators. IEEE Trans. Circuits Syst. II Express Briefs 69 (3) (2022)
Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park
Time multiplexed LBIST for in-field testing of automotive AI accelerators. IEICE Electron. Express 18 (24) (2021)
Umair Saeed Solangi, Muhammad Ibtesam, Muhammad Adil Ansari, Jinuk Kim, Sungju Park
Test Architecture for Systolic Array of Edge-Based AI Accelerator. IEEE Access 9 (2021)
Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park
Master-slave based test cost reduction method for DNN accelerators. IEICE Electron. Express 18 (24) (2021)
Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park
CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience. IEEE Access 8 (2020)
Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (8) (2018)
Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
Erratum to "Time-Multiplexed-Network for Test Cost Reduction". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (9) (2018)
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs (7) (2017)
Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
Time-multiplexed test access architecture for stacked integrated circuits. IEICE Electron. Express 13 (14) (2016)
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS (2015)
Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park
Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. ATS (2015)
Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers 63 (8) (2014)
Jongsun Bae, Sanghyeon Baeg, Sungju Park
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. 61 (12) (2012)
Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. Asian Test Symposium (2011)
Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs (7) (2010)
Jeonghye Han, Seungmin Lee, Bokhyun Kang, Sungju Park, Jungkwan Kim, Myungsook Kim, Mihee Kim
A trial english class with a teaching assistant robot in elementary school. HRI (2010)
Hyunbean Yi, Sungju Park, Sandip Kundu
On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2010)
Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2009)
Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs (1) (2009)
Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs (5) (2009)
Hyunbean Yi, Sungju Park, Sandip Kundu
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS (2008)
Eun-ja Hyun, So-yeon Kim, Siekyung Jang, Sungju Park
Comparative study of effects of language instruction program using intelligence robot and multimedia on linguistic ability of young children. RO-MAN (2008)
Hyunbean Yi, Jaehoon Song, Sungju Park
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park
An Efficient Secure Scan Design for an SoC Embedding AES Core. ITC (2008)
Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS (2007)
Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park
Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS (2007)
Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference (2007)
Hyunbean Yi, Jaehoon Song, Sungju Park
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC (2006)
Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (11) (2006)
Jeonghye Han, Miheon Jo, Sungju Park, Sungho Kim
The educational use of home robots for children. RO-MAN (2005)
Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park
Hybrid test data compression technique for SOC scan testing. SoCC (2005)
Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski
A new state assignment technique for testing and low power. DAC (2004)
Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon
An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. Human.Society@Internet 2003 (2003)
Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler
A Genetic Algorithm for the Minimization of OPKFDDs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2002)
Jaehoon Song, Sungju Park
A Simple Wrapped Core Linking Module for SoC Test Access. Asian Test Symposium (2002)
NamRye Son, YoJin Yang, Gueesang Lee, Sungju Park
A New Boundary Matching Algorithm Based on Edge Detection. EurAsia-ICT (2002)
Sungju Park, Dongman Lee, Mingyu Lim, Chansu Yu
Scalable data management using user-based caching and prefetching in distributed virtual environments. VRST (2001)
Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler
Minimization of OPKFDDs Using Genetic Algorithms. DSD (2001)
Dongkyu Youn, Taehyung Kim, Sungju Park
A Microcode-Based Memory BIST Implementing Modified March Algorithm. Asian Test Symposium (2001)
Sungju Park, Taehyung Kim
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. DATE (2000)
Jongwook Park, Sang-Hoon Shin, Sungju Park
A partial scan design by unifying structural analysis and testabilities. ISCAS (2000)
Sungju Park
A New Complete Diagnosis Patterns for Wiring Interconnects. DAC (1996)
Sungju Park, Sheldon B. Akers
Parity bit calculation and test signal compaction for BIST applications. J. Electron. Test. 3 (1) (1992)
Sungju Park, Sheldon B. Akers
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. ITC (1992)
Sungju Park, Sheldon B. Akers
Parity Bit Calculation and Test Signal Compaction for BIST Applications. ITC (1991)
Sheldon B. Akers Jr., Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan
Why is less information from logic simulation more useful in fault simulation? ITC (1990)