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Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults.
Jaehoon Song
Juhee Han
Hyunbean Yi
Taejin Jung
Sungju Park
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2009)
Keyphrases
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test cases
data sets
fault diagnosis
pattern mining
fault detection
root cause
real time
test data
similar patterns
built in self test
database
mutation testing
test sequences
test generation
test suite
statistical significance
statistical tests
pattern discovery
data mining techniques