Hyunbean Yi

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 2

Top Topics

Defect Detection

Genetic Algorithm

Semiconductor Devices

Top Venues

IEEE Trans. Circuits Syst. II Express Briefs

Publications

Sookeun Song, Taegeun Kang, Kyungtae Lim, Konmin Kim, Hyunbean Yi
Sow Posture Analysis and Estrus Prediction Using Closed-Circuit Television Cameras. IEEE Access 12 (2024)
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs (7) (2017)
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS (2015)
Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara
A Failure Prediction Strategy for Transistor Aging. IEEE Trans. Very Large Scale Integr. Syst. 20 (11) (2012)
Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs (7) (2010)
Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara
Aging test strategy and adaptive test scheduling for SoC failure prediction. IOLTS (2010)
Hyunbean Yi, Sungju Park, Sandip Kundu
On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2010)
Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2009)
Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs (1) (2009)
Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs (5) (2009)
Hyunbean Yi, Sungju Park, Sandip Kundu
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS (2008)
Hyunbean Yi, Jaehoon Song, Sungju Park
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Hyunbean Yi, Sandip Kundu
Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. DFT (2008)
Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS (2007)
Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park
Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS (2007)
Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference (2007)
Hyunbean Yi, Jaehoon Song, Sungju Park
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC (2006)
Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (11) (2006)
Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park
Hybrid test data compression technique for SOC scan testing. SoCC (2005)
Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon
An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. Human.Society@Internet 2003 (2003)