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A Failure Prediction Strategy for Transistor Aging.
Hyunbean Yi
Tomokazu Yoneda
Michiko Inoue
Yasuo Sato
Seiji Kajihara
Hideo Fujiwara
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
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failure prediction
high speed
low power
integrated circuit
optimal strategy
evolutionary algorithm
low level
data fusion